As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://eduardoyjryg.blogspothub.com/38320116/logic-synthesis-as-the-bridge-between-rtl-design-and-silicon-implementation